Phan, Hoang-Phuong and Dao, Dzung Viet and Wang, Li and Dinh, Toan 
ORCID: https://orcid.org/0000-0002-7489-9640 and Nguyen, Nam-Trung and Qamar, Afzaal and Tanner, Philip and Dimitrijev, Sima and Zhu, Yong
(2015)
The effect of strain on the electrical conductance of p-type nanocrystalline silicon carbide thin films.
Journal of Materials Chemistry C.
Abstract
This paper presents for the first time the effect of strain on the electrical conductance of p-type nanocrystalline SiC grown on a Si substrate. The gauge factor of the p-type nanocrystalline SiC was found to be 14.5 which is one order of magnitude larger than that in most metals. This result indicates that mechanical strain has a significant influence on the electrical conductance of p-type nanocrystalline SiC, which is promising for mechanical sensing applications in harsh environments.
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| Item Type: | Article (Commonwealth Reporting Category C) |
|---|---|
| Refereed: | Yes |
| Item Status: | Live Archive |
| Faculty/School / Institute/Centre: | Historic - Faculty of Health, Engineering and Sciences - School of Mechanical and Electrical Engineering (1 Jul 2013 - 31 Dec 2021) |
| Faculty/School / Institute/Centre: | Historic - Faculty of Health, Engineering and Sciences - School of Mechanical and Electrical Engineering (1 Jul 2013 - 31 Dec 2021) |
| Date Deposited: | 24 Aug 2020 04:54 |
| Last Modified: | 24 Aug 2020 04:54 |
| Fields of Research (2008): | 09 Engineering > 0913 Mechanical Engineering > 091306 Microelectromechanical Systems (MEMS) |
| Fields of Research (2020): | 40 ENGINEERING > 4017 Mechanical engineering > 401705 Microelectromechanical systems (MEMS) |
| Socio-Economic Objectives (2008): | E Expanding Knowledge > 97 Expanding Knowledge > 970109 Expanding Knowledge in Engineering |
| Identification Number or DOI: | https://doi.org/10.1039/c4tc02679a |
| URI: | http://eprints.usq.edu.au/id/eprint/38231 |
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