Influence of external mechanical stress on electrical properties of single-crystal n-3C-SiC/p-Si heterojunction diode

Qamar, Afzaal and Dao, Dzung Viet and Tanner, Philip and Phan, Hoang-Phuong and Dinh, Toan ORCID: https://orcid.org/0000-0002-7489-9640 and Dimitrijev, Sima (2015) Influence of external mechanical stress on electrical properties of single-crystal n-3C-SiC/p-Si heterojunction diode. Applied Physics Express, 8 (5). 061302-1. ISSN 1882-0778


Abstract

This article reports for the first time the electrical properties of fabricated n-3C-SiC/p-Si heterojunction diodes under external mechanical stress in the [110] direction. An anisotype heterojunction diode of n-3C-SiC/p-Si was fabricated by depositing 3C-SiC onto the Si substrate by low-pressure chemical vapor deposition. The mechanical stress significantly affected the scaling current density of the heterojunction. The scaling current density increases with stress and is explained in terms of a band offset reduction at the SiC/Si interface under applied stress. A reduction in the barrier height across the junction owing to applied stress is also explained quantitatively.


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Item Type: Article (Commonwealth Reporting Category C)
Refereed: Yes
Item Status: Live Archive
Faculty/School / Institute/Centre: Current - Faculty of Health, Engineering and Sciences - School of Mechanical and Electrical Engineering (1 Jul 2013 -)
Faculty/School / Institute/Centre: Current - Faculty of Health, Engineering and Sciences - School of Mechanical and Electrical Engineering (1 Jul 2013 -)
Date Deposited: 16 Sep 2020 04:50
Last Modified: 17 Jun 2021 00:03
Uncontrolled Keywords: Applied stress; Band offsets; Barrier heights; Heterojunction diodes; Mechanical stress; Si substrates; SiC/Si interface; [110] direction
Fields of Research (2008): 09 Engineering > 0913 Mechanical Engineering > 091306 Microelectromechanical Systems (MEMS)
02 Physical Sciences > 0203 Classical Physics > 020399 Classical Physics not elsewhere classified
Fields of Research (2020): 40 ENGINEERING > 4017 Mechanical engineering > 401705 Microelectromechanical systems (MEMS)
51 PHYSICAL SCIENCES > 5103 Classical physics > 510399 Classical physics not elsewhere classified
Socio-Economic Objectives (2008): E Expanding Knowledge > 97 Expanding Knowledge > 970102 Expanding Knowledge in the Physical Sciences
Identification Number or DOI: https://doi.org/10.7567/APEX.8.061302
URI: http://eprints.usq.edu.au/id/eprint/38225

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