Atomic disorders in layer structured topological insulator SnBi2Te4 nanoplates

Zou, Yi-Chao and Chen, Zhi-Gang and Zhang, Enze and Kong, Fantai and Lu, Yan and Wang, Lihua and Drennan, John and Wang, Zhongchang and Xiu, Faxian and Cho, Kyeongjae and Zou, Jin (2018) Atomic disorders in layer structured topological insulator SnBi2Te4 nanoplates. Nano Research, 11 (2). pp. 696-706. ISSN 1998-0124


Identification of atomic disorders and their subsequent control has proven to be a key issue in predicting, understanding, and enhancing the properties of newly emerging topological insulator materials. Here, we demonstrate direct evidence of the cation antisites in single-crystal SnBi2Te4 nanoplates grown by chemical vapor deposition, through a combination of sub-angstrom-resolution imaging, quantitative image simulations, and density functional theory calculations. The results of these combined techniques revealed a recognizable amount of cation antisites between Bi and Sn, and energetic calculations revealed that such cation antisites have a low formation energy. The impact of the cation antisites was also investigated by electronic structure calculations together with transport measurement. The topological surface properties of the nanoplates were further probed by angle-dependent magnetotransport, and from the results, we observed a two-dimensional weak antilocalization effect associated with surface carriers. Our approach provides a pathway to identify the antisite defects in ternary chalcogenides and the application potential of SnBi2Te4 nanostructures in next-generation electronic and spintronic devices.

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Item Type: Article (Commonwealth Reporting Category C)
Refereed: Yes
Item Status: Live Archive
Additional Information: First online 17 August 2017. Restricted access to published version in accordance with the copyright policy of the publisher.
Faculty/School / Institute/Centre: Current - Institute for Advanced Engineering and Space Sciences - Centre for Future Materials
Date Deposited: 28 Mar 2018 00:44
Last Modified: 15 May 2018 00:57
Uncontrolled Keywords: metal chalcogenide; antisite defect; nanoplate; scanning transmission electron microscopy; magnetotransport
Fields of Research : 09 Engineering > 0912 Materials Engineering > 091205 Functional Materials
Socio-Economic Objective: E Expanding Knowledge > 97 Expanding Knowledge > 970109 Expanding Knowledge in Engineering
Funding Details:
Identification Number or DOI: 10.1007/s12274-017-1679-z

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