Formation of defects in the graphite oxidization process: a positron study

Gong, Wei and He, Dongning and Tao, Jinlong and Zhao, Pengfei and Kong, Lingxue and Luo, Yongyue and Peng, Zheng and Wang, Hao (2015) Formation of defects in the graphite oxidization process: a positron study. RSC Advances, 5 (108). pp. 88908-88914.


High-resolution positron annihilation lifetime (PAL) and two-detector coincidence Doppler broadening of
annihilation radiation (2D-DBAR) measurements on graphite and its oxide derivatives for defect information,
differing in oxidization agents, are reported. Positron measurements were found to be very effective in the
investigation of defects in graphite and its derivatives. Positrons are mainly annihilated in vacancy-like
defects on the particle surface and in large open-volume holes associated with the interface of graphite
and graphite oxide. Different types of defects have been detected for unexfoliated graphite oxide and
exfoliated graphene oxide based on 2D-DBAR measurements, namely the vacancy cluster and vacancyoxygen
complexes. It is also interesting to observe that the calculated large open-volume diameter of
graphene oxide coincides with the distance between the layers from the XRD investigation, which
indicates that the annihilation of the long-lived lifetime component T3 might take place in the area
between the graphene layers; no large open-volume hole has been detected.

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Item Type: Article (Commonwealth Reporting Category C)
Refereed: Yes
Item Status: Live Archive
Additional Information: Permanent restricted access to Published version in accordance with the copyright policy of the publisher.
Faculty / Department / School: Current - Faculty of Health, Engineering and Sciences - School of Mechanical and Electrical Engineering
Date Deposited: 19 Feb 2016 02:16
Last Modified: 05 Sep 2016 02:10
Fields of Research : 03 Chemical Sciences > 0303 Macromolecular and Materials Chemistry > 030304 Physical Chemistry of Materials
Identification Number or DOI: 10.1039/c5ra14660g

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