Integrating the impact of wheat fungal diseases in the Belgian crop yield forecasting system (B-CYFS)

El Jarroudi, Moussa and Kouadio, Louis and Bertrand, Martin and Curnel, Yannick and Giraud, Frederic and Delfosse, Philippe and Hoffmann, Lucien and Oger, Robert and Tychon, Bernard (2012) Integrating the impact of wheat fungal diseases in the Belgian crop yield forecasting system (B-CYFS). European Journal of Agronomy, 40. pp. 8-17. ISSN 1161-0301


Field experiments were conducted over four growing seasons to assess the relationship between fungal disease attacks and wheat grain yield in the agrometeorological part of the Belgian crop yield forecasting system (i.e., Belgian crop growth monitoring system, B-CGMS) by recalibrating the lifespan of wheat leaves (SPAN parameter). The results from 133 experimental fields in Belgium (the Wallonia region) and the Grand-Duchy of Luxembourg were analyzed in terms of site factors such as cultivar, previous crop, sowing date and geographical area. A significant relationship was found between green leaf area (GLA) duration expressing the infection pressure (parameter m; using a modified Gompertz model and calculated from observed GLA) and final grain yield (R2=0.79; P<0.001). Based on this relationship and by recalibrating the B-CGMS in terms of its SPAN parameter, there was a significant improvement in estimating final grain yield. From a R2 of 0.11 when the B-CGMS was run with the default SPAN value, the relationship between observed and simulated yields was strengthened, with a R2 of 0.47 and 0.57, respectively, when a linear or quadratic relationship was considered between m and SPAN. Although, from a practical point of view, the m value has to be estimated annually for each spatial grid or group of grids on the basis of field or possibly remotely sensed data, and although estimating this parameter is possible only late in the season, these encouraging results illustrate the potential of integrating pest and disease impact in the B-CGMS.

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Item Type: Article (Commonwealth Reporting Category C)
Refereed: Yes
Item Status: Live Archive
Additional Information: © 2012 Elsevier B.V. Permanent restricted access to published version due to publisher copyright policy.
Faculty/School / Institute/Centre: Historic - Faculty of Sciences - No Department
Date Deposited: 16 Oct 2014 10:47
Last Modified: 15 Mar 2017 06:02
Uncontrolled Keywords: yield forecasting; B-CGMS; SPAN parameter; fungal disease; leaf senescence
Fields of Research : 07 Agricultural and Veterinary Sciences > 0701 Agriculture, Land and Farm Management > 070105 Agricultural Systems Analysis and Modelling
06 Biological Sciences > 0605 Microbiology > 060505 Mycology
07 Agricultural and Veterinary Sciences > 0703 Crop and Pasture Production > 070308 Crop and Pasture Protection (Pests, Diseases and Weeds)
Socio-Economic Objective: B Economic Development > 82 Plant Production and Plant Primary Products > 8205 Winter Grains and Oilseeds > 820507 Wheat
Identification Number or DOI: 10.1016/j.eja.2012.02.003

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