Siuly, and Li, Yan and Wen, Peng (2011) EEG signal classification based on simple random sampling technique with least square support vector machine. International Journal of Biomedical Engineering and Technology, 7 (4). pp. 390-409. ISSN 1752-6418
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Official URL: http://www.inderscience.com/search/index.php?action=record&rec_id=44417&prevQuery=&ps=10&m=or
Identification Number or DOI: doi: 10.1504/IJBET.2011.044417
Abstract
This paper proposes a new approach based on Simple Random Sampling (SRS) technique with Least Square Support Vector Machine (LS-SVM) to classify two-class of electroencephalogram (EEG) signals. The experiments are carried out on two EEG databases and a synthetic Ripley dataset. All two-class pairs are tested and our proposed approach obtains a 95.58% average classification accuracy for the EEG epileptic database, 98.73% for the mental imagery tasks EEG database and 100% for Ripley data. We compare our method with two most recent methods for the epileptic database. Experimental results demonstrate that the proposed method is more promising than previously reported classification techniques.
| Item Type: | Article (Commonwealth Reporting Category C) |
|---|---|
| Additional Information: | Permanent restricted access to published version due to publisher copyright policy. |
| Uncontrolled Keywords: | EEG; electroencephalogram; simple random sampling technique; LS-SVM; least square support vector machine; signal classification; feature extraction. |
| Fields of Research (FOR2008): | 10 Technology > 1004 Medical Biotechnology > 100402 Medical Biotechnology Diagnostics (incl. Biosensors) 09 Engineering > 0906 Electrical and Electronic Engineering > 090609 Signal Processing 09 Engineering > 0903 Biomedical Engineering > 090302 Biomechanical Engineering |
| Subjects: | UNSPECIFIED |
| Socio-Economic Objective (SEO2008): | E Expanding Knowledge > 97 Expanding Knowledge > 970110 Expanding Knowledge in Technology |
| ID Code: | 20310 |
| Deposited By: | |
| Deposited On: | 05 Jan 2012 12:15 |
| Last Modified: | 31 Jul 2012 09:20 |
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