Parisi, Alfio and Meldrum, L. R. and Kimlin, Michael G. (1999) Polysulphone film thickness and its effects in ultraviolet radiation dosimetry. In: Protection Against the Hazards of UVR Internet Conference, 18 Jan - 5 Feb 1999.
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[Abstract]: Polysulphone film thickness and the effects on the dose calibration in ultraviolet radiation dosimetry were investigated. Compared to those obtained with the dose calibration for the 45 micrometre thick film the erythemal exposures determined from the dose calibrations for the 18, 20 and 30 micrometre thick film ranged from 33% to 45%. The absolute of the differences averaged to 22%, 37% and 19% for the 18, 20 and 30 micrometre thick respectively. The variations in the dose response of polysulphone film with different thickness have shown that the dose response is highly dependent on the film thickness and highlighted the importance of employing polysulphone film of consistent and reproducible thickness in ultraviolet photobiology research.
|Item Type:||Conference or Workshop Item (Commonwealth Reporting Category E) (Paper)|
|Additional Information:||No evidence of copyright restrictions. Authors are conference organisers.|
|Uncontrolled Keywords:||polysulphone, UV, thickness, solar, skin cancer, erythema, dosimeter|
|Fields of Research (FOR2008):||02 Physical Sciences > 0299 Other Physical Sciences > 029904 Synchrotrons; Accelerators; Instruments and Techniques|
|Subjects:||240000 Physical Sciences > 249900 Other Physical Sciences > 249903 Instruments and Techniques|
|Socio-Economic Objective (SEO2008):||UNSPECIFIED|
|Deposited On:||11 Oct 2007 10:39|
|Last Modified:||27 Jun 2012 12:03|
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